SPIE Defense + Security 2027

Date：18-22 April 2027

Frequency：Annual

Place：Gaylord Palms Resort & Convention Center，Orlando, Florida, US

Organizer: SPI

INTERODUCTION

Share your research on advanced optics and photonics in Orlando. The 2027 call for papers is open.

Explore the 2027 call for papers and submit your recent work to the premier international conference on advanced technologies for defense and security. This SPIE event in Orlando event attracts researchers from academia, government, and industry for a week of discussion and discovery. The three-day exhibition showcases companies developing the next generation of components, devices, and systems.

Four conference tracks featuring hundreds of technical presentations

Materials and Devices
Imaging and Analytics
Advanced Sensing and Imaging
Next-generation Sensor Systems and Applications

WHY EXHIBIT

Meet in person and discuss your products with new prospects and decision makers tasked with rapid procurement of the best solutions, components, instruments, and system providers to enhance capabilities for defense and security applications.
Connect with customers and build relationships with new prospects.
– Grow revenue
– Identify the most promising opportunities in the industry
– Demo your new products
– Gain exposure with strategically placed advertising and available sponsorships
– Network with the industry’s leading experts

PRODUCTS

Technology

ccd cameras 
detectors, sensors 
infrared/thermal cameras 
machine vision systems 
optical components - filters, mirrors, other 
test and measurement, metrology 
ultraviolet and infrared 
cameras and imaging systems 
image sensors 
infrared, thermal 
interferometer, white light/roughness to measure roughness 
interferometers, including shape of optics 
laser components and accessories 
line-scan cameras 
multi-element 
objectives 
optical coatings, thin films 
other lenses 
spectral imaging cameras 
spherical 
systems 
antireflection 
aspheric 
beam profilers 
beam quality measurement 
beam shapers, splitters, expanders 
beam splitters 
camera 
chemicals 
cleaning equipment 
cnc centering equipment 
cnc grinding and polishing equipment 
coating equipment / machines 
conventional diamond machining equipment 
conventional grinding and polishing equipment 
cooling equipment and systems 
cutting equipment 
defect/surface quality 
detector arrays 
dielectric 
diffractive optics and gratings 
domes 
edging equipment 
electronic, digital imaging 
electronic components 
fiber bragg gratings 
fiber lasers 
fiber manufacturing equipment 
fiber optics and accessories 
fiber optics test and measurement 
filters 
focal-plane arrays 
highly reflective coatings 
image intensifiers 
infrared coatings 
inspection & test equipment 
laser-delivery systems 
laser energy measurement 
lasers and systems 
lens blanks 
light measurements 
manufacturing 
metallic coatings 
microtechnology 
mirrors and reflectors 
near-infrared 
optical fabrication equipment 
optical fiber, fiber optic cables 
optical mounts 
other beam steering optics 
other camera/imaging systems 
other coatings 
other components 
other detectors 
other fiber optics products 
other instrumentation and test equipment 
other optical components 
other subcomponents 
plano 
plastic coatings 
polishing equipment (e.g. "spindles") 
power and energy meters 
power meters 
prisms - nonpolarizing 
prisms - polarizing 
radiometers and photometers 
sensing-systems 
spectroscopy devices and equipment 
spheres 
sub-aperture finishing 
testing and analysis 
ultraviolet coatings 
wavefront meters 
windows 
x-ray imaging 

Application

tracking, target designation 
laser industry 
other military applications 
video surveillance 
advanced imaging 
biomedical, medical imaging, health care 
defense, security, law enforcement 
inspection 
lens manufacturing, coating 
night vision systems 
assembly 
astronomy 
basic research, science 
crnbe applications; trace element detection 
object recognition/screening 
optical design and engineering 
physics 
process control 
raw materials inspection 
rifle scopes 
semiconductor manufacturing 
sensor networks 
trace element detection 
agriculture and foresty 
aircraft, vehicles 
consumer electronics 
diagnostic tools, detection, imaging 
earth sciences, environmental monitoring, climate 
eyeglasses, contact lenses 
food inspection 
laboratory research: physical and analytical 
machine vision, factory automation 
manufacturing 
materials processing, lasers in manufacturing 
microscopy 
military and homeland security applications 
non-lethal weapons 
nondestructive testing 
optics manufacturing 
pharmaceutical inspection 
pollution control 
pollution detection 
range-finder/distance measurement 
soil, air, water contamination (trace element detection); pollution control 
solar & alternative energy 

Contact:  Mr. Nick Ni 

Tel: 021-36050835      Fax: 021-36050835

Mobile: 13901684989

Email: pe_nickni@163.com

Address: Room 601&611&607, Carnival Building, No. 210, 1st Dahua Road, Baoshan District, Shanghai